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USB

Les solutions logicielles USB émetteur/récepteur de Tektronix répondent aux besoins en matière de validation électrique, de conformité, de caractérisation et de débogage des ingénieurs chargés de la conception de systèmes USB 3.1 Type-C, USB 3.1 et USB 2.0, qui doivent être conformes aux normes de test USB-IF. Est aussi disponible une solution pour la mesure des paramètres électriques et de protocole pour la conformité USB-PD.

Solution de test automatisé pour USB 3.1 Type-C

  • Identifiez rapidement l’origine des problèmes lors du test de conceptions SuperSpeed USB 3.1 Type-C avec la combinaison de la prise en charge complète de SigTest et DPOJET. Fiche technique du logiciel USB 3.1 »

Test des émetteurs et des récepteurs avec les oscilloscopes et les BERT Tektronix 

  • Les BERTScope de série BSX prennent en charge les DPP intégrés de première génération à 5 Gbit/s et de deuxième génération à 10 Gbit/s et les architectures basées sur des protocoles. 
  • Effectuez des analyses de protocole en même temps que la validation électrique à l’aide du déclenchement sur séquence série sur les oscilloscopes MSO/DPO70000 DX
  • Bénéficiez de la caractérisation la plus fidèle et de l’analyse de marge la plus précise avec les oscilloscopes DPO70000SX, qui présentent le niveau de bruit le plus faible du marché.

En savoir plus sur nos solutions pour les systèmes basés sur l'USB 3.1 type C, l'USB 3.2 et l'USB 2.0.

Bibliothèque

Title
The Basics of Serial Data Compliance and Validation Measurements
High-speed serial bus architectures are the new norm in today’s high-performance designs. While parallel bus standards are undergoing some changes, serial buses are established across multiple markets …
USB 3.0 Physical Layer Measurements
High Speed Interface Standards
This e-Guide will help you learn more about design challenges for testing PCIe 4.0, SAS, SuperSpeed USB, and DDR4 standards. Within the pages of the eGuide you will also get quick access to technical …
Advanced Serdes Debug with a BERT
Learn simple strategies to pinpoint bit errors to the exact bit position and timing with powerful Error Location Analysis and a BERT.
USB 2.0 Compliance Solution
This fact sheet details the recommended equipment to meet the USB 2.0 compliance testing requirements. 
Understanding and Performing USB 2.0 Electrical Testing and Debugging
USB 2.0 is used in a wide range of applications, thanks to its performance, reliability and relatively low cost. Automated USB 2.0 compliance testing may be used to prepare for formal compliance …
USB 3.1 What you need to know - Reference Guide
Quickly and easily reference important USB specifications without having to comb through hundreds of pages. This guide includes important Electrical Test Parameters, reference pictures for Compliance …
USB 3.1 Receiver Compliance Testing
In this application note, all aspects of USB 3.1 receiver testing are covered, including stressed eye calibration and jitter tolerance testing with measured device margin.        
Simplifying Validation and Debug of USB 3.1 Designs
This application note will explain the evolution of the Universal Serial Bus (USB) standard and testing approaches that have been developed to accommodate the increasing speed and complexity of this …
Troubleshooting USB 2.0 Problems with Your Oscilloscope
Learn the basics of the USB 2.0 physical layer to help you troubleshoot bus problems or system issues.  Learn how to set up and interpret the results when using automated decoding, triggering, and …
Application Kit for USB 3.1 Transmitter and Receiver Testing
This kit contains the following application notes:   USB 3.1 Receiver Compliance Testing covers all aspects of USB 3.1 receiver testing, including stressed eye calibration and jitter tolerance …
How to Debug USB 3.1 Gen1 and Gen2 Electrical Compliance Failures
Learn more about the Type-C connector and the benefits it brings to USB 3.1, the latest USB 3.1 specifications, and how you can go beyond compliance testing to get to the bottom of issues that east …
Debugging Serial Buses in Embedded System Designs
Learn the basics of the hardware protocols of the most common serial buses, such as I2C, SPI , USB, RS-232/422/485/UART, CAN, CAN FD, LIN, FlexRay, Ethernet, and I2S/LJ/RJ/TDM.  Find out how to use …
Title
Electrical Validation of the Type-C Interface
The introduction of the Type-C interface, and its implementation across multiple high-demand serial standards, has created new challenges for developers. These include new compliance channel …
Testing USB 31
With computer peripheral devices demanding more bandwidth; the industry is making its move to faster serial I/O. USB3.1 brings a staggering 10Gb/sec to computing peripherals. View this short webinar …
Simplify your USB TypeC Design Validation From Complexity to Confidence
Comprehensive tools for debugging failures are key to building confidence that your product will pass compliance and achieve certification. This in-depth webinar will help simplify your validation …
Title
USBSSP DPOJET MOI
This MOI specifies the testing procedures for USB 3.1 Transmitter Tests (Gen 1 and Gen 2) using Tektronix DPOJET and Tektronix Oscilloscopes. 
USB 2.0 Hub MOI
High-Speed Electrical Testing - Hub MOI 
USB 3.1 Receiver Testing MOI
This MOI reviews the methods used for USB 3.1 (10 Gb/s) receiver compliance testing using the BERTScope Bit Error Rate Testers. 
USB 2.0 Test Procedures MOI
USB 2.0 Test Procedures Method of Implementation  
USB 3.0 Receiver Testing MOI
This MOI reviews the methods used for USB 3.0 receiver compliance testing using the BERTScope Bit Error Rate Testers. 
USB 3.1 Cable Tests MOI
This MOI specifies the testing procedures for the SuperSpeed channels of a USB 3.1 cable and mated cable assembly including Type-C to Type-C and Type-C to legacy connectors. 
USB 3.0 Cable Tests MOI
This MOI specifies the testing procedures for the Super Speed channels of a USB 3.0 cable and mated cable assembly. 
USB 2.0 Host MOI
High-Speed Electrical Testing - Host MOI 
Tektronix USB2.0 Device MOI
USB 2.0 Universal Serial Bus Measurement MOI 
Tektronix High-Speed Electrical Testing - Host MOI
High-Speed Electrical Testing - Host MOI 
High-Speed Electrical Testing - Hub MOI
High-Speed Electrical Testing - Hub MOI