Contactez-nous

Chat en direct avec un représentant Tek. Service disponible de 9 h à 17 h, CET jours ouvrables.

Téléphone

Appelez-nous au

Disponible de 9 h à 17 h CET jours ouvrables.

Télécharger

Télécharger des manuels, des fiches techniques, des logiciels, etc. :

TYPE DE TÉLÉCHARGEMENT
MODÈLE OU MOT CLÉ

Feedback

2461 SourceMeter SMU Instrument

The 2461 High Current SourceMeter® Source Measure Unit (SMU) Instrument brings advanced Touch, Test, Invent® technology right to your fingertips. It combines an innovative graphical user interface (GUI) with capacitive touchscreen technology to make testing intuitive and minimize the learning curve to help engineers and scientists learn faster, work smarter, and invent easier. With its 10 A/1000 W pulse current and 7 A/100 W DC current capability combined with dual 18-bit 1MS/s digitizers, the 2461 is optimized for characterizing and testing high power materials, devices, and modules, such as silicon carbide (SiC), gallium nitride (GaN), DCDC converters, circuit protection devices, solar cells and panels, high brightness LEDs and lighting systems, electrochemical cells and batteries, and much more. These new capabilities, combined with Keithley’s expertise in high precision, high accuracy SMU instruments, will make the 2461 a "go-to instrument" for high current sourcing and high speed measurement applications in the lab and in the rack for years to come.

2001 SPECIFIED CALIBRATION INTERVALS

To help users who wish to transition to the 2461 from Keithley’s legacy 2420, 2425, 2430, and 2440 SMUs, the 2461 now includes four SCPI emulation modes for each of the older models, minimizing SCPI code rewriting and maximizing your investment.

Key Features

  • One tightly coupled instrument that combines the capabilities of analyzers, curve tracers, and I-V systems at a fraction of their cost
  • Wide coverage up to 105 V/7 A DC 100 W, 100 V/10 A Pulse 1000 W max.
  • Dual 1 MS/s digitizers for fast sampling measurements
  • Five-inch, high resolution capacitive touchscreen GUI
  • 0.012% DCV accuracy with 6½-digit resolution
  • Source and sink (4-quadrant) operation
  • Four "Quickset" modes for fast setup and measurements
  • Context-sensitive help function
  • Front panel input banana jacks; rear panel mass termination screw connections
  • SCPI and Test Script Processor (TSP®) programming modes
  • Front-panel USB 2.0 memory I/O port for transferring data, test scripts, or test configurations
2001 SPECIFIED CALIBRATION INTERVALS
The 2461’s home screen makes testing intuitive and helps minimize the learning curve for new users.

Learn Faster, Work Smarter, Invent Easier

The 2461 features a five-inch, full-color, high resolution touchscreen that supports intuitive operation, helps operators become familiar with the instrument quickly, and optimizes overall speed and productivity. A simple icon-based menu structure reduces the number of steps required to configure a test by as much as 50 percent and eliminates the cumbersome multi-layer menu structures typically used on soft-key instruments. Built-in, contextsensitive help supports intuitive operation and minimizes the need to review a separate manual. These capabilities, combined with the 2461’s high versatility, simplify its operation in both basic and advanced measurement applications, regardless of the user’s previous experience in working with SMU instruments.

2001 SPECIFIED CALIBRATION INTERVALS
The graphical SMU’s icon-based menu structure helps even novice users configure tests quickly and confidently.

Capture Real Device Operation with the Built-in Dual 1 MS/sec Digitizers

Capturing and displaying real device operation, waveforms, and transient events just got easier with the 2461’s digitizing function. The two built-in 1 MS/sec, 18-bit digitizers make it possible to acquire both voltage and current waveforms simultaneously without the need to use a separate instrument. The digitizing functions employ the same DC voltage and current measure ranges that the standard A/D converter uses. In addition, the voltage digitizing function uses the same DC voltage 10 GΩ input impedance levels to reduce loading significantly on the device under test (DUT).

2001 SPECIFIED CALIBRATION INTERVALS
The high speed digitizing function allows capturing and displaying voltage and current measurements simultaneously.

Comparison of 2461 vs. 2420, 2425, 2430, 2440

Feature 2461 2420/2425/2440 2430
Max Voltage 100 V 60 V/100 V/40 V 100 V
Max DC Current 7 A 3 A/3 A/5 A 3 A
Max Pulse Current 10 A NA 10 A
DC/Pulse Power 100 W/1000 W Up to 100 W/NA 100 W/1000 W
Digitizers Dual 18-bit 1 MS/s None None
Wideband Noise <4.5 mVrms typ. 10 mVrms typ. 10 mVrms typ.
Sweep Types Linear, Log, Dual Linear, Dual Log, Custom Linear, Log, Custom, Source-Memory Linear, Log, Custom, Source-Memory
Reading Buffer Size >2 Million Point Reading Buffer 5000 Point Reading Buffer 5000 Point Reading Buffer
Programming Command Type SCPI Programming + TSP Scripting SCPI SCPI
PC interface GPIB, USB, Ethernet (LXI) GPIB, RS-232 GPIB, RS-232
Signal Input Connections Front: Banana Jacks
Rear: Mass Screw Terminal Connection
Front/Rear Banana Jacks Front/Rear Banana Jacks

All-in-One SMU Instrument

The 2461, built on the fourth generation of the awardwinning SourceMeter SMU platform, leverages the proven capabilities of previously introduced high current SMU instruments from Keithley, including the 2420, 2425, and 2440. It offers a highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current measurements. This all-in-one instrument gives you the capabilies of a:

  • Precision power supply with V and I readback
  • True current source
  • Digital multimeter (DCV, DCI, ohms, and power with 6½-digit resolution)
  • Precision electronic load
  • Pulse generator
  • Trigger controller
2001 SPECIFIED CALIBRATION INTERVALS
2461 Power Envelope

Ease of Use Beyond the Touchscreen

In addition to its five-inch color touchscreen, the 2461 Graphical SourceMeter front panel offers a variety of features that enhance its speed, user-friendliness, and learnability, including a USB 2.0 memory I/O port, a HELP key, a rotary navigation/ control knob, a front/rear input selector button, and banana jacks for basic bench applications. The USB 2.0 memory port simplifies storing test results and instrument configurations, uploading test scripts into the instrument, and installing system upgrades. All front-panel buttons are backlit to enhance visibility in low-light environments.

2001 SPECIFIED CALIBRATION INTERVALS
The 2461’s high resolution, capacitive touchscreen and front panel controls allow for intuitive operation, even by novice users.
2001 SPECIFIED CALIBRATION INTERVALS
2461 rear panel connections are optimized to maintain signal integrity and speed system setup.

Four "Quickset" modes simplify instrument setup. With one touch, the instrument can be quickly configured for various operating modes without the need to configure the instrument indirectly for this operation.

2001 SPECIFIED CALIBRATION INTERVALS
One-touch Quickset modes speed measurement setups and minimize the time to measurements.

Comprehensive Built-in Connectivity

Rear panel access to rear-input connectors, remote control interfaces (GPIB, USB 2.0, and LXI/Ethernet), D-sub 9-pin digital I/O port (for internal/external trigger signals and handler control), instrument interlock control, and TSP-Link®jacks make it simple to configure multiple instrument test solutions and eliminate the need to invest in additional adapter accessories..

Convert Raw Data to Information

A full graphical plotting window converts raw data and displays it immediately as useful information, such as semiconductor I-V curves and digitized waveforms. The touchscreen interface makes it easy to observe, interact with, and explore measurements with "pinch and zoom" simplicity. By using the built-in graphing cursors, you can immediately analyze your data without a PC. All graphic screens can be saved to a USB thumb drive for incorporation into reports and journals. Using the graphical SMU’s Sheet view, test data can also be displayed in tabular form. The instrument supports exporting data to a spreadsheet for further analysis, dramatically improving productivity for research, benchtop testing, device qualification, and debugging. This combination of high performance and high ease of use offers unparalleled insight into your test results.

2001 SPECIFIED CALIBRATION INTERVALS
2001 SPECIFIED CALIBRATION INTERVALS
2001 SPECIFIED CALIBRATION INTERVALS
2001 SPECIFIED CALIBRATION INTERVALS

Built-in functions like real-time graphing, charting, scope-like cursors, and data display spreadsheet for export simplify converting test results into useful information.

Typical Applications

Ideal for current/voltage characterization and functional test of a wide range of today's modern electronics and devices, including:

  • Power semiconductors and materials
    • – SiC, GaN
    • – IGBTs, Power MOSFETs,HBLEDs
    • – Thyristors
  • Power management and protection devices
    • – Telecom power management chipsets
    • – DC-DC converters
    • – Metal-oxide varistors (MOV), transient voltage suppressors (TVS)
  • Electrochemistry
    • – Galvanic cycling
    • – Cyclic voltammetry
    • – Electro-deposition
2001 SPECIFIED CALIBRATION INTERVALS 2001 SPECIFIED CALIBRATION INTERVALS 2001 SPECIFIED CALIBRATION INTERVALS 2001 SPECIFIED CALIBRATION INTERVALS 2001 SPECIFIED CALIBRATION INTERVALS 2001 SPECIFIED CALIBRATION INTERVALS

TriggerFlow®Building Blocks for Instrument Control and Execution

The 2461 incorporates Keithley’s TriggerFlow triggering system, which provides user control over instrument execution. TriggerFlow diagrams are created in much the same way that flow charts are developed, using four fundamental building block types:

  • Wait – Waits for an event to occur before the flow continues
  • Branch – Branches when a condition has been satisfied
  • Action – Initiates an action in the instrument, for example, measure, source, delay, set digital I/O, etc
  • Notify – Notifies other equipment that an event has occurred
2001 SPECIFIED CALIBRATION INTERVALS
TriggerFlow building blocks allow creating triggering models that range from very simple to highly complex.

A TriggerFlow model using a combination of these building blocks can be created from the front panel or by sending remote commands. With the TriggerFlow system, users can build triggering models from very simple to complex with up to 63 block levels. The 2461 also includes basic triggering functions, including immediate, timer, and manual triggering.

Contact Check Function

The Contact Check function makes it simple to verify good connections quickly and easily before an automated test sequence begins. This eliminates measurement errors and false failures associated with contact fatigue, breakage, contamination, loose or broken connection, relay failures, etc. Some capabilities of this function are:

  • <100 μs verification and notification process time
  • 3 pass/fail threshold values: 2 Ω, 15 Ω, and 50 Ω
  • Enabled remotely over the GPIB, USB, or Ethernet (LXI) interfaces

Unmatched System Integration and Programming Flexibility

When a 2461 is configured into a multi-channel I-V test system, its embedded Test Script Processor (TSP®) allows it to run test scripts, so users can create powerful measurement applications with significantly reduced development times. TSP technology also offers channel expansion without a mainframe. Keithley’s TSP-Link® channel expansion bus, which uses a 100 Base T Ethernet cable, can connect multiple graphical SourceMeter SMUs (2450, 2460, 2461), and other TSP instruments such as Keithley’s DMM7510 7½-Digit Graphical Sampling Multimeter, Series 2600B System SourceMeter SMU instruments, and Series 3700A Switch/Multimeter systems in a master-subordinate configuration that operates as one integrated system. The TSP-Link expansion bus supports up to 32 units per GPIB or IP address, making it easy to scale a system to fit an application’s particular requirements. The 2461 also includes a SCPI programming mode that takes advantage of all of the instrument’s capabilities.

Parallel Test Capability

The TSP technology in the 2461 supports testing multiple devices in parallel to meet the needs of device research, advanced semiconductor lab applications, and even high throughput production test. This parallel testing capability allows each instrument in the system to run its own complete test sequence, creating a fully multi-threaded test environment. The number of tests that can be run in parallel on a graphical SourceMeter can be as high as the number of instruments in the system.

2001 SPECIFIED CALIBRATION INTERVALS
KickStart start-up software lets users be ready to make measurements in minutes.

Instrument Control Start-up Software

KickStart instrument control/start-up software enables users to start making measurements in minutes without programming. In most cases, users merely need to make some quick measurements, graph the data, and store the data to disk for later analysis in software environments such as Excel. KickStart offers:

  • Configure and control up to four SMU instruments for DC or Pulsed I-V test in either the same app, same project, or a combination of the two.
  • Create tests by mixing any of these SMU instruments:2400 Graphical Series, 2400 Standard Series (DC only), 2600B Series, 2651A, 2657A, and 6430 SourceMeter®SMU (DC only) instruments.
  • Differentiate SMU instrument channels and their measurement data using labels that are relevant to your device or module.
  • Native X-Y graphing, panning, and zooming; screenshot capturing of graphs.
  • Spreadsheet/tabular viewing of data; export data for further analysis.
  • Annotating of tests; save test setups.
  • GPIB, USB 2.0, Ethernet compliance.

Optional Apps Tailored for your Characterization Needs

The 2461 is an excellent tool to define nearly any DC test you choose for characterizing materials, electronic devices and modules. For more specific needs, Keithley offers oninstrument software apps that alter the 2461’s behavior, fitting your instrument to your needs. These apps can be installed directly to your 2461 by connecting to Keithley’s KickStart instrument control software and opening the relevant app in KickStart.

I-V Tracer App

Curve tracing analysis is a critical task for many users in the semiconductor development supply chain. Engineers and technicians both hold the traditional curve tracer as the simplest, fastest method for generating characteristic I-V curves on a device. They are heavily used by engineers in failure analysis and incoming inspection to qualify parts, identify counterfeit devices, and to quickly identify the location of a failure on damaged devices. SMUs have typically been limited to predefined sweeps with longer set up times than curve tracers — until I-V Tracer.

Keithley’s I-V Tracer app leverages the touchscreen and front-panel knob of the 2461 to allow precise, live control over the SMU output while viewing I-V results of 2 terminal devices. At each individual output level current and voltage are measured and plotted. The small footprint of the SMU enables portable bench top use, reserving high power (kW) traditional curve tracers for special cases. The power envelope of the 2461 allows it to comfortably operate in the low power range of traditional curve tracers like the Tektronix 576 and Tektronix 370A, while offering enhanced low current measurements.

2001 SPECIFIED CALIBRATION INTERVALS
AC mode with I-V Tracer, available on the 2461.

Once installed, I-V Tracer exists on the SMU itself, meaning I-V tracer can be used wherever your SMU can go, without a continuous remote connection. It can also integrate with KickStart to enable simple data collection and comparison on the PC, simplifying the preparation of reports used in failure analysis or teaching labs at colleges and universities.

I-V Tracer capabilities with the 2461:

  • Use the full DC power envelope of the 2461 (max 100 V or 7 A)
  • Trace by sourcing voltage or current, positive or negative
  • Use AC polarity to continuously sweep positive and negative about 0 to see the full behavior of your device
  • Pulse mode with adjustable pulse width to limit selfheating effects
  • 2 or 4-wire sense
  • Compare mode for verifying against a reference device
  • Reading table view to see exact measurements
  • Easily copy curves and settings to your PC with KickStart

Simplified Programming with Ready-to-Use Instrument Drivers

For those who prefer to create their own customized application software, native National Instruments LabVIEW®drivers, as well as IVI-C and IVI-COM drivers, are available at www.tek.com/keithley.

Voltage Specifications 1, 2
Source Measure3
Range Max. DC Current Resolution Accuracy (23° ± 5°C)
1 Year ±(% setting + volts)
Noise (RMS) (<10 Hz) Resolution4 Accuracy (23° ± 5°C)
1 Year ±(% rdg. + volts)
Digitizer Accuracy5 (23° ± 5°C)
1 Year ±(% rdg. + volts)
200.0000 mV 7.35 A 5 μV 0.015% + 200 µV 1 µV 100 nV 0.012% + 200 µV 0.05% + 1.2 mV
2.000000 V 7.35 A 50 µV 0.015% + 300 µV 2 µV 1 µV 0.012% + 300 µV 0.05% + 1.2 mV
7.000000 V 7.35 A 250 µV 0.015% + 2.4 mV 20 µV 1 µV 0.015% + 1 mV 0.05% + 8 mV
10.00000 V 5.25 A 250 µV 0.015% + 2.4 mV 20 µV 10 µV 0.015% + 1 mV 0.05% + 8 mV
20.00000 V 4.20 A 500 µV 0.015% + 2.4 mV 20 µV 10 µV 0.015% + 1 mV 0.05% + 8 mV
100.0000 V 1.05 A 2.5 mV 0.015% + 15 mV 100 µV 100 µV 0.015% + 5 mV 0.05% + 40 mV
Current Specifications1, 2, 6
Source Measure3
Range Max. DC Voltage Resolution Accuracy (23° ±5°C)
1 Year ±(% setting + amps)
Noise (RMS) (<10 Hz) Resolution4 Accuracy (23° ± 5°C)
1 Year ±(% rdg. + volts)
Digitizer Accuracy5 (23° ±5°C)
1 Year ±(% rdg. + amps)
1.000000 μA 105 V 50 pA 0.025% + 1 nA 40 pA 1 pA 0.025% + 700 pA 0.05% + 4 nA
10.00000 μA 105 V 500 pA 0.025% + 1.5 nA 40 pA 10 pA 0.025% + 1 nA 0.05% + 8 nA
100.0000 μA 105 V 5 nA 0.020% + 15 nA 100 pA 100 pA 0.020% + 10 nA 0.05% + 80 nA
1.000000 mA 105 V 50 nA 0.020% + 150 nA 1 nA 1 nA 0.020% + 100 nA 0.05% + 800 nA
10.00000 mA 105 V 500 nA 0.020% + 1.5 μA 10 nA 10 nA 0.020% + 1 µA 0.05% + 8 μA
100.0000 mA 105 V 5 μA 0.020% + 15 μA 100 nA 100 nA 0.020% + 10 µA 0.05% + 80 μA
1.000000 A 105 V 50 μA 0.050% + 750 μA 5 μA 1 μA 0.050% + 500 µA 0.05% + 1 mA
4.000000 A 21 V 250 μA 0.100% + 3 mA 25 μA 1 μA 0.100% + 2.5 mA 0.10% + 5 mA
5.000000 A 10.5 V 250 μA 0.100% + 3 mA 25 μA 1 μA 0.100% + 2.5 mA 0.10% + 5 mA
7.000000 A 7.35 V 500 μA 0.150% + 6 mA 125 μA 1 μA 0.150% + 5 mA 0.15% + 10 mA
10.000000 A7 7.35 V 500 μA 0.150% + 6 mA 125 μA 10 μA 0.150% + 5 mA 0.15% + 10 mA

Voltage Burden8 <100 μV all ranges.


Temperature Coefficient ±(0.10 × accuracy specification)/°C, 0° to 18 °C and 28° to 50 °C.

Notes

1. Speed = 1 PLC.

2. All specifications guaranteed with output ON.

3. Accuracies apply to 2-wire and 4-wire modes when properly zeroed.

4. Measure resolution 6.5 digits. Digitizer resolution limited by noise.

5. 18-bit ADC. Average of 1000 samples taken at 1 μs intervals. Internal temperature within ±5°C and 1 week of ACAL.

6. Accuracy specifications guaranteed when using 2461-KIT screw terminal accessory for 2461.

7. 10 A range DC specifications valid up to 7.35 A. Operation >7.35 A only in pulse mode. Pulse width and duty cycle limits apply. See Pulse Specifications and Typical Pulse Performance sections for more details on pulse operation.

8. 4-wire mode


Resistance Measurement Accuracy (Local or Remote Sense)9, 10, 11
Range Resolution12 Default Test Current Normal Accuracy
(23°C ±5°C),
1 Year ±(% rdg. + ohms)
Enhanced Accuracy13
(23°C ±5°C)
1 Year, ±(% rdg. + ohms)
<2.000000 Ω14 1 μΩ User defined Source.IACC + Meas.VACC Meas.IACC + Meas.VACC
2.000000Ω 1 μΩ 100 mA 0.05 % +0.003Ω 0.04 % +0.001Ω
20.00000Ω 10 μΩ 100 mA 0.05 % +0.003Ω 0.04 % +0.001Ω
200.0000Ω 100 μΩ 10 mA 0.05 % +0.03Ω 0.04 % +0.01Ω
2.000000kΩ 1 mΩ 1 mA 0.05 % +0.3Ω 0.04 % +0.1Ω
20.00000kΩ 10 mΩ 100 μA 0.05 % +3Ω 0.04 % +1Ω
200.0000kΩ 100 mΩ 10 μA 0.05 % +30Ω 0.05 % +10Ω
2.000000 MΩ 10 μA 0.06 % +100Ω 0.06 % +50Ω
20.00000 MΩ 10Ω 1 μA 0.14 % +1kΩ 0.12 % +500Ω
200.0000 MΩ 100Ω 100 nA 1.04 % +10kΩ 0.74 % +5kΩ
>200.0000 MΩ14 - User defined Source.IACC + Meas.VACC Meas.IACC + Meas.VACC
Temperature Coefficient (0°–18 °C and 28°–50 °C) ±(0.10 × accuracy specification)/°C.
Source Current, Measure Resistance Mode Total uncertainty = Isource accuracy + Vmeasure accuracy (4-wire remote sense).
Source Voltage, Measure Resistance Mode Total uncertainty = Vsource accuracy + Imeasure accuracy (4-wire remote sense).

Notes

9. Speed = 1 PLC.

10. All specifications are guaranteed with output ON.

11. Accuracies apply to 2- and 4-wire mode when properly zeroed.

12. 6.5-digit measure resolution.

13. Source readback enabled. Offset compensation ON.

14. Source current, measure resistance or source voltage, measure resistance only.


Additional Pulse Mode Source Specifications

Minimum Programmable Pulse Width 150 μs. (Digitizing mode only with source readback disabled) Note: Time for settling and/or measuring may be longer than 150 μs.
Maximum Extended Range Pulse Width 2.5 ms for 7 A and lower ranges, 1 ms for 10 A range.
Maximum DC Pulse Width 10,000 seconds.
Pulse Width Programming Resolution Variable, limited by Pulse Width and Pulse Width Jitter.
Pulse Width Jitter <(50 μs + 10% of pulse width), typical, ACQIN Readings = OFF.
Maximum Pulse Duty Cycle 10% for 20 V and lower ranges, 5% for 100 V range.

Typical Pulse Performance (Best fixed range, 4W sense)

Source Value Limit Range and Value Load Rise Time (10% to 90%) Settling Time (1% of range)
100 V 10.5 A 10 Ω 300 μs 520 μs
100 V 1.05 A 200 Ω 180 μs 320 μs
20 V 10 A 2 Ω 150 μs 340 μs
10 A 105 V 10 Ω 300 μs 700 μs
7 A 7.35 V 1 Ω 120 μs 360 μs
5 A 10.5 V 2 Ω 110 μs 280 μs

Contact Check

Contact Check Speed

<100 μs for verification and notification

Resistance Settings 2 Ω 15 Ω 50 Ω
No contact check failure <1.0 Ω <10.0 Ω <40.0 Ω
Always contact check failure >6.0 Ω >20.0 Ω >60.0 Ω

Digitizer Characteristics

Maximum Resolution. 18 bits.
Available Measurement Functions Voltage, Current, Simultaneous Voltage and Current, Resistance, Power.
Sampling Rate15 Programmable 1 k through 1 million samples per second.
Volatile Sample Memory with Timestamp 27.5 million.
Minimum Record Time 1 μs.
Timestamp Resolution 1 ns with standard or full buffer style. 1 μs with compact buffer style.
Maximum Record Length 5 million.
Range Selection Fixed-range required for digitizer measurements.
Measurement Settling Time Range and load dependent. Accuracy limited by settling time for 10 mA and lower current ranges.

Notes

15. Sample rate is not continuously adjustable. For valid discrete settings, see the Model 2461 Reference Manual.


Supplemental Characteristics

Max. Output Power 1050 W pulse, 105 W DC, four quadrant source or sink operation.
Overrange 105% of range, source and measure.
Regulation Voltage: Line: 0.01% of range. Load: 0.01% of range + 100 µV.
Current: Line: 0.01% of range. Load: 0.01% of range + 100 pA.
Source Limits Voltage Source Current LimitBipolar current limit set with single value. Min. 10% of range.
Current Source Voltage Limit Bipolar voltage limit set with single value. Min. 10% of range.
V/I-Limit Accuracy Add 0.3% of setting and ±0.02% of reading to base specification.
Overshoot Voltage Source <0.1% typical. Step size = Full scale, resistive load, 20 V range, 10 mA I-limit).
Current Source <0.1% typical. Step size = 1 mA step, RLoad = 10 kΩ, 20 V range)
Range Change Overshoot Overshoot into a fully resistive 100 kΩ load, 10 Hz to 20 MHz bandwidth, adjacent ranges: <250 mV typical.
Output Settling Time Time required to reach 0.1% of final value after command is processed and output slew: 20 V range,100 mA I-limit: <200 μs typical.
Maximum Slew Rate 1 V per µs, 100 V range, 100 mA limit into a 20 kΩ load (typical). 0.6 V per µs, 20 V range, 100 mA limit into a 20 kΩ load (typical).
Over Voltage Protection User selectable values, 5% ±0.5 V tolerance. Factory default = none.
Voltage Source Noise 10 Hz to 20 MHz (RMS): <4.5m V typical into a resistive load.
Common Mode Voltage 250 V DC.
Common Mode Isolation >1 GΩ, <1000 pF.
Noise Rejection (typical)
NPLC NMRR CMRR
0.01 - 60 dB
0.1 - 60 dB
1 60 dB 100 dB
Load Impedance Normal Mode: 20 nF typical.
High Capacitance Mode: Stable into 50 μF typical. High-C mode valid for ≥100 µA ranges.
Max. Voltage Drop Between Force and Sense Terminals 5 V.
Max. Sense Lead Resistance 1 MΩ for rated accuracy.
Guard Offset Voltage <300 µV, typical.

System Measurement Speeds16

Reading Rates (readings/second) typical for 60 Hz (50 Hz), script (TSP®) programmed

NPLC Trigger Origin Measure to Memory Measure to GPIB/USB/LAN Source-Measure to Memory Source-Measure to GPIB/USB/LAN
0.01 Internal 3050 (2800) 2800 (2500) 1700 (1600) 1650 (1550)
0.01 External 2300 (2100) 2150 (2000) 1650 (1550) 1600 (1450)
0.1 Internal 540 (460) 530 (450) 470 (410) 470 (400)
0.1 External 500 (420) 500 (420) 460 (390) 450 (350)
1 Internal 59 (49) 59 (49) 58 (48) 58 (48)
1 External 58 (48) 58 (48) 57 (48) 57 (46)

Reading Rates (readings/second) typical for 60 Hz (50 Hz), SCPI programmed

NPLC Trigger Origin Measure to Memory Measure to GPIB/USB/LAN Source-Measure to Memory Source-Measure to GPIB/USB/LAN
0.01 Internal 3000 (2800) 3000 (2790) 1700 (1600) 1550 (1500)
0.01 External 2330 (2150) 2330 (2150) 1650 (1550) 1500 (1450)
0.1 Internal 540 (460) 540 (460) 470 (410) 460 (400)
0.1 External 510 (430) 510 (430) 470 (400) 460 (390)
1 Internal 59 (49) 59 (49) 58 (48) 58 (48)
1 External 58 (49) 58 (49) 58 (48) 58 (48)

Notes

16. Reading rates applicable for voltage or current measurements, autozero off, autorange off, filter off, binary reading format, and source readback off.


Digitize, Typical

Sampling Rate Digits Resolution, Bits Measure to USB
10 kS/s 18 Up to 10 kS/s
20 kS/s 16 Up to 20 kS/s
50 kS/s 16 Up to 50 kS/s
100 kS/s 15 Up to 100 kS/s
1 MS/s 12 At least 100 kS/s

SCPI Programmed. Buffer style is compact.

General Characteristics (default mode unless specified)

Factory Default Standard Power-Up SCPI Mode
Source Output Modes Fixed DC Level, Memory/Configuration List (mixed function), Sweep (linear and logarithmic), Sweep (dual linear and dual logarithmic).
Memory Buffer >2 million readings, user adjustable. Includes selected measured value(s) and time stamp.
Real-Time Clock Lithium battery backup (3 yr.+ battery life).
Remote Interfaces
GPIB IEEE-488.2
USB Device (rear panel, type B) 2.0 Full Speed USBTMC.
USB Host (front panel, type A) USB 2.0, support for thumb drives.
Ethernet RJ-45 (10/100BT).
Digital I/O Interface:
Lines 6 Input/Output user defined for digital I/O or triggering.
Connector 9-pin female D.
Input Signal Levels 0.7 V (maximum logic low), 3.7 V (minimum logic high).
Input Voltage Limits -0.25 V (Abs. minimum), +5.25 V (Abs. maximum).
Maximum Source Current +2.0 mA @ >2.7 V (per pin).
Maximum Sink Current -50 mA @ 0.7 V (per pin, solid-state fuse protected).
5V Power Supply Pin Limited to 500 mA @ >4 V (solid-state fuse protected).
Handler Start of test, end of test, 4 category bits.
Programmability SCPI or TSP command sets.
TSP Mode Embedded Test Script Processor (TSP) accessible from any host interface.
IP Configuration Static or DHCP.
Expansion Interface The TSP-Link expansion interface allows TSP enabled instruments to trigger and communicate with each other.
LXI Compliance 1.5 LXI Device Specification 2016.
Display 5 inch capacitive touch, color TFT WVGA (800×480) with LED backlight.
Input Signal Connections Front: Banana. Rear: Mass termination screw terminal.
Interlock Active High Input.
Cooling Forced air, variable speed.
Over Temperature Protection Internally sensed temperature overload puts unit in standby mode.
Power Supply 100 V to 240 V RMS, 50–60 Hz (automatically detected at power up).
VA Rating 350 volt-amps max.
Altitude Maximum 2000 meters above sea level.
EMC Conforms to European Union EMC Directive.
Safety Compliance with CE and NRTL listed to UL61010-1 and UL61010-2-30. Conforms with European Union Low Voltage Directive.
Vibration MIL-PRF-28800F Class 3 Random.
Warm-Up 1 hour to rated accuracies.
Dimensions With bumpers and handle: 106 mm high × 255 mm wide × 425 mm deep (4.18 in × 10.05 in × 16.75 in).
Without bumpers and handle: 88 mm high × 213 mm wide × 403 mm deep (3.46 in × 8.39 in × 15.87 in.)
Weight With bumpers and handle: 4.75 kg (10.5 lbs.).
Without bumpers and handle: 4.55 kg (10.0 lbs.).
Environment Operating: 0° to 50 °C, 70% R.H. up to 35 °C. Derate 3% R.H./°C, 35° to 50 °C.
Storage: –25 °C to 65 °C.

Ordering Information

2461 100 V, 10 A, 1000 W SourceMeter Instrument

Supplied Accessories

2460-KIT Rear Panel Mating Mass Terminated Screw Connector
8608 High Performance Test Leads
USB-B-1 USB Cable, Type A to Type B, 1 m (3.3 ft)
CS-1616-3 Safety Interlock Mating Connector
17469460X TSP-Link/Ethernet Cable
Documentation available at www.tektronix.com
2461 QuickStart Guide
Test Script Builder Software (available at www.tek.com/keithley)
KickStart Startup Software (available at www.tek.com/keithley)
LabVIEW and IVI Drivers (available at www.tek.com/keithley)

Available Accessories

Test Leads and Probes
5805 Kelvin (4-Wire) Spring-Loaded Probes
5806 Kelvin Clip Lead Set
8606 High Performance Modular Probe Kit
Cables, Connectors, Adapters
2460-BAN Screw Terminal Connector to Banana Cable
2460-KIT Mating Mass Termination Connector
CS-1616-3 Safety Interlock Mating Connector
Communication Interfaces and Cables
7007-1 Shielded GPIB Cable, 1 m (3.3 ft)
KPCI-488LPA IEEE-488 Interface for PCI Bus
KUSB-488B IEEE-488 USB-to-GPIB Interface Adapter
Rack Mount Kits
4299-8 Single Fixed Rack Mount Kit
4299-9 Dual Fixed Rack Mount Kit
Software Options
I-V Tracer Graphical SMU Curve Tracer Software
Kickstart Instrument Control Software

Available Services

2461-3Y-EW 1 Year Factory Warranty extended to 3 years from date of shipment
2461-5Y-EW 1 Year Factory Warranty extended to 5 years from date of shipment
C/2461-3Y-17025 KeithleyCare® 3 Year ISO 17025 Calibration Plan
C/2461-3Y-DATA KeithleyCare 3 Year Calibration w/Data Plan
C/2461-3Y-STD KeithleyCare 3 Year Std. Calibration Plan
C/2461-5Y-17025 KeithleyCare 5 Year ISO 17025 Calibration Plan
C/2461-5Y-DATA KeithleyCare 5 Year Calibration w/Data Plan
C/2461-5Y-STD KeithleyCare 5 Year Std. Calibration Plan
C/NEW DATA Calibration Data for New Units
C/NEW DATA ISO ISO-17025 Calibration Data for New Units

Warranty Information

Warranty Summary This section summarizes the warranties of the 2461. For complete warranty information, refer to the Tektronix warranty page at www.tek.com/service/warranties/warranty-2. Any portion of the product that is not manufactured by Keithley is not covered by this warranty and Keithley will have no duty to enforce any other manufacturer's warranties.
Hardware Warranty Keithley Instruments, Inc. warrants the Keithley manufactured portion of the hardware for a period of one year from defects in materials or workmanship; provided that such defect has not been caused by use of the Keithley hardware which is not in accordance with the hardware instructions. The warranty does not apply upon any modification of Keithley hardware made by the customer or operation of the hardware outside the environmental specifications.
Software Warranty Keithley warrants for the Keithley produced portion of the software or firmware will conform in all material respects with the published specifications for a period of ninety (90) days; provided the software is used on the product for which it is intended in accordance with the software instructions. Keithley does not warrant that operation of the software will be uninterrupted or error-free, or that the software will be adequate for the customer's intended application. The warranty does not apply upon any modification of the software made by the customer.